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Previews available in: English
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Edition | Availability |
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1
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
1441942858 9781441942852
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2
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
June 21, 2007, Springer
in English
0387465464 9780387465463
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3
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English
0387465472 9780387465470
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- Created April 29, 2008
- 8 revisions
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December 29, 2022 | Edited by MARC Bot | import existing book |
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June 29, 2019 | Edited by MARC Bot | import existing book |
August 5, 2010 | Edited by IdentifierBot | added LibraryThing ID |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |