Check nearby libraries
Buy this book
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Previews available in: English
Showing 3 featured editions. View all 3 editions?
Edition | Availability |
---|---|
1
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
1441942858 9781441942852
|
zzzz
Libraries near you:
WorldCat
|
2
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English
0387465472 9780387465470
|
zzzz
Libraries near you:
WorldCat
|
3
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
June 21, 2007, Springer
in English
0387465464 9780387465463
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Classifications
ID Numbers
Community Reviews (0)
Feedback?History
- Created April 29, 2008
- 8 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
December 29, 2022 | Edited by MARC Bot | import existing book |
September 10, 2021 | Edited by ImportBot | import existing book |
June 29, 2019 | Edited by MARC Bot | import existing book |
August 5, 2010 | Edited by IdentifierBot | added LibraryThing ID |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |