Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Last edited by MARC Bot
December 29, 2022 | History

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Publish Date
Publisher
Springer
Language
English
Pages
328

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Previews available in: English

Edition Availability
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English

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Book Details


Classifications

Library of Congress
TK7888.4TK1-9971TA17, TK7871.99.M44 S23 2007

ID Numbers

Open Library
OL7445893M
Internet Archive
defectorientedte00sach_685
ISBN 10
0387465464
ISBN 13
9780387465463
OCLC/WorldCat
79447484
Library Thing
6363014
Goodreads
5028072

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 29, 2022 Edited by MARC Bot import existing book
September 10, 2021 Edited by ImportBot import existing book
June 29, 2019 Edited by MARC Bot import existing book
August 5, 2010 Edited by IdentifierBot added LibraryThing ID
April 29, 2008 Created by an anonymous user Imported from amazon.com record