An edition of In situ real time characterization of thin films
(2000)
In Situ Real-Time Characterization of Thin Films
by Orlando Auciello
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Subjects
Thin films, PhysicsShowing 3 featured editions. View all 3 editions?
| Edition | Availability |
|---|---|
1
In Situ Real-Time Characterization of Thin Films
2008, Wiley & Sons, Incorporated, John
in English
0470304073 9780470304075
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WorldCat
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2
In situ real time characterization of thin films: edited by Orlando Auciello, Alan R. Krauss
2001, Wiley
in English
0471241415 9780471241416
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3
In Situ Real-Time Characterization of Thin Films
November 20, 2000, Wiley-Interscience
in English
0471241415 9780471241416
|
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Libraries near you:
WorldCat
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Book Details
First Sentence
"As thin-film materials, device structures, and processing conditions become increasingly more complex, there is a growing need for in situ, real-time, surface-specific analytical tools to characterize phenomena occurring at interfaces between layered structures and at the surface of thin films during growth."
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- Created April 29, 2008
- 5 revisions
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| July 31, 2019 | Edited by MARC Bot | associate edition with work OL18828650W |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |