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Edition | Availability |
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1
Characterization and metrology for ULSI technology: 1998 international conference, Gaithersburg, Maryland, March 1998
1998, American Institute of Physics
in English
1563967537 9781563967535
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2
Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)
December 14, 1998, American Institute of Physics
Hardcover
in English
- 1 edition
1563967537 9781563967535
|
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Libraries near you:
WorldCat
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Book Details
Edition Notes
Includes bibliographical references and indexes.
"The 1998 International Conference on Characterization and Metrology for ULSI Technology was held at the National Institute of Standards and Technology from March 23 to March 27, 1998"--Pref.
Accompanying computer disc contains full text from the book.
System requirements for accompanying computer disc: IBM PC or compatible; hard disk with at least 4 MB free; at least 4 MB RAM; Windows 95 or Windows 3.1.; Acrobat Reader.
System requirements for Macintosh computer disk: Macintosh, Power Mac, or compatible; hard disk with 4 MB free; 2 MB RAM; System 7 or later; Acrobat Reader.
System requirements for Unix computer disk: SUN Sparcstation; hard disk with 8 MB free; 32 MB RAM; SunOS version 4.1.3 or later, Solaris 2.3, 2.4. or 2.4 or later; Acrobat Reader.
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