An edition of Characterization and metrology for ULSI technology
(1998)
Characterization and Metrology for Ulsi Technology
1998 International Conference (AIP Conference Proceedings, Vol. 449)
1 edition
by David G. Seiler
Share
×Close
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
| Edition | Availability |
|---|---|
1
Characterization and metrology for ULSI technology: 1998 international conference, Gaithersburg, Maryland, March 1998
1998, American Institute of Physics
in English
1563967537 9781563967535
|
zzzz
Libraries near you:
WorldCat
|
|
2
Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)
December 14, 1998, American Institute of Physics
Hardcover
in English
- 1 edition
1563967537 9781563967535
|
aaaa
Libraries near you:
WorldCat
|
Book Details
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?
History
- Created April 30, 2008
- 4 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
| July 31, 2019 | Edited by MARC Bot | associate edition with work OL19424797W |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |