An edition of Oxide Reliability
(2002)
Oxide Reliability
A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)
by D. J. Dumin
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Last edited by Open Library Bot
April 24, 2010 | History
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Publish Date
January 31, 2002
Publisher
World Scientific Publishing Company
Language
English
Pages
280
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| Edition | Availability |
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1
Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)
January 31, 2002, World Scientific Publishing Company
Hardcover
in English
9810248423 9789810248420
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Book Details
First Sentence
"The metal-oxide-semiconductor (MOS) transistor was invented in 1960 [1, 2]."
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- Created April 30, 2008
- 5 revisions
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| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| December 15, 2009 | Edited by WorkBot | link works |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |