| Record ID | marc_loc_updates/v35.i25.records.utf8:1806417:1355 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v35.i25.records.utf8:1806417:1355?format=raw |
LEADER: 01355cam a2200301 a 4500
001 81600063
003 DLC
005 20070615184611.0
008 820415s1981 dcua f000 0 eng c
010 $a 81600063
020 $c$5.00
040 $aDGPO/DLC$cDLC$dDLC
050 00 $aQC100$b.U57 no. 611$aT50
082 00 $a602/.18 s$219
086 0 $aC 13.10:611
100 1 $aFrench, Judson C.
245 10 $aNew technology challenges metrology /$cJudson C. French.
260 $aWashington, D.C. :$bU.S. Department of Commerce, National Bureau of Standards :$bFor sale by the Supt. of Docs., U.S. G.P.O.,$c1981.
300 $a87 p. :$bill. ;$c28 cm.
440 0 $aNBS special publication ;$v611
500 $a"Presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, Argentina, September 4-7, 1979."
500 $a"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
500 $a"Issued July 1981."
500 $aS/N 003-003-02341-8
650 0 $aMeasurement$xTechnological innovations.
710 1 $aUnited States.$bNational Bureau of Standards.
710 2 $aCenter for Electronics and Electrical Engineering (U.S.)
711 2 $aInteramerican Metrology Conference$d(1979 :$cBuenos Aires, Argentina)