New technology challenges metrology

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
New technology challenges metrology
Judson C. French
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

Buy this book

Last edited by MARC Bot
October 21, 2020 | History

New technology challenges metrology

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Buy this book

Book Details


Edition Notes

"Presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, Argentina, September 4-7, 1979."
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
"Issued July 1981."
S/N 003-003-02341-8

Published in
Washington, D.C
Series
NBS special publication ;, 611

Classifications

Dewey Decimal Class
602/.18 s
Library of Congress
QC100 .U57 no. 611, T50 .U57 no. 611

The Physical Object

Pagination
87 p. :
Number of pages
87

ID Numbers

Open Library
OL3919202M
LCCN
81600063

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
October 21, 2020 Edited by MARC Bot import existing book
December 14, 2009 Edited by WorkBot link works
December 14, 2009 Edited by WorkBot link works
April 25, 2009 Edited by ImportBot Found a matching Library of Congress MARC record
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record