An edition of Secondary ion mass spectrometry, SIMS X (1997)

Secondary ion mass spectrometry, SIMS X

proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Secondary ion mass spectrometry, SIMS X
International Conference on Se ...
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Notes

Check nearby libraries

Buy this book

Last edited by ImportBot
October 17, 2022 | History
Edit
An edition of Secondary ion mass spectrometry, SIMS X (1997)

Secondary ion mass spectrometry, SIMS X

proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Wiley
Language
English
Pages
1057

Check nearby libraries

Buy this book

Subjects
Secondary ion mass spectrometry, Congresses, Ions, spectra, Mass spectrometry

Showing 2 featured editions. View all 2 editions?

Edition Availability
Cover of: Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry: SIMS X
May 1997, John Wiley & Sons Ltd (Import)
Paperback in English
Libraries near you: WorldCat
Cover of: Secondary ion mass spectrometry, SIMS X
Secondary ion mass spectrometry, SIMS X: proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995
1997, Wiley
in English
  • Not in Library
Libraries near you: WorldCat

Add another edition?

Book Details

Edition Notes

Published in
Chichester
Other Titles
SIMS X, Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X)

Classifications

Dewey Decimal Class
543.0873
Library of Congress
QD96.S43 I58 1995

The Physical Object

Pagination
xxv, 1057 p. :
Number of pages
1057

ID Numbers

Open Library
OL20311974M
ISBN 10
0471958972
OCLC/WorldCat
36720512
Goodreads
4354840

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON
October 17, 2022 Edited by ImportBot import existing book
January 26, 2010 Edited by WorkBot add more information to works
December 11, 2009 Created by WorkBot add works page