An edition of Advanced characterization techniques for optics, semiconductors, and nanotechnologies III (2007)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III

28-29 August 2007, San Diego, California, USA

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Advanced characterization techniques for opti ...
Angela Duparré, Angela Duparré
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Last edited by MARC Bot
May 28, 2023 | History
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An edition of Advanced characterization techniques for optics, semiconductors, and nanotechnologies III (2007)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III

28-29 August 2007, San Diego, California, USA

by

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Publish Date
Publisher
SPIE
Language
English

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Subjects

Optical properties, Characterization, Semiconductors, Optoelectronics, Thin films, Optoelectronic devices, Congresses, Optical measurements, Nanotechnology, Interferometry
Edition Availability
Cover of: Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III: 28-29 August 2007, San Diego, California, USA
2007, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 6672, Proceedings of SPIE--the International Society for Optical Engineering -- v. 6672.

Classifications

Library of Congress
TA1750 .A333 2007,

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL25085345M
ISBN 10
0819468207
ISBN 13
9780819468208
LCCN
2010287972
OCLC/WorldCat
174117963

Source records

Library of Congress MARC record
Library of Congress MARC record
Better World Books record
harvard_bibliographic_metadata record

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History

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May 28, 2023 Edited by MARC Bot import existing book
November 4, 2011 Created by LC Bot import new book