An edition of Microelectronics failure analysis (2011)

Microelectronics failure analysis

desk reference

6th ed.

by

Cover of: Microelectronics failure analysis by Richard J. Ross, Richard J. Ross
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Last edited by MARC Bot
December 19, 2022 | History
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An edition of Microelectronics failure analysis (2011)

Microelectronics failure analysis

desk reference

6th ed.

by

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Publish Date
Publisher
ASM International
Language
English
Pages
660

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Previews available in: English

Subjects

Semiconductors, Testing, Microelectronics, Handbooks, manuals, Materials, Defects, Electronics, Electronic apparatus and appliances, TECHNOLOGY & ENGINEERING, Digital
Edition Availability
Cover of: Microelectronics failure analysis
Microelectronics failure analysis: desk reference
2011, ASM International
in English - 6th ed.

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Book Details

Edition Notes

Includes bibliographical references and index.

System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.

Published in
Materials Park, Ohio

Classifications

Library of Congress
TK7871 .M52 2011, TK7871 .M52 2011eb

The Physical Object

Pagination
xi, 660 p. :
Number of pages
660

Edition Identifiers

Open Library
OL25190617M
Internet Archive
microelectronics00comm
ISBN 13
9781615037254
LCCN
2012359075
OCLC/WorldCat
771901447

Work Identifiers

Work ID
OL16490636W

Source records

Library of Congress MARC record
Library of Congress MARC record
Library of Congress MARC record
Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
December 19, 2022 Edited by MARC Bot import existing book
November 13, 2020 Edited by MARC Bot import existing book
February 1, 2012 Created by LC Bot import new book