Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

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Last edited by ImportBot
December 29, 2021 | History

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

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Publish Date
Language
English

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Previews available in: English

Edition Availability
Cover of: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
May 28, 2013, Springer
paperback
Cover of: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
2011, Springer Science+Business Media, LLC
electronic resource / in English

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Book Details


Edition Notes

Published in
New York, NY
Series
Springer Theses

Classifications

Library of Congress
TP807-823TA418.9.C6Q, TA455.C43

The Physical Object

Format
[electronic resource] /

ID Numbers

Open Library
OL25542546M
Internet Archive
atomicscalechara00walk
ISBN 13
9781441978165, 9781441978172

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History

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December 29, 2021 Edited by ImportBot import existing book
August 2, 2020 Edited by ImportBot import existing book
June 28, 2019 Edited by MARC Bot import existing book
July 28, 2014 Created by ImportBot import new book