An edition of In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing (1999)

In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing

19-21 May, 1999, Edinburgh, Scotland

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Cover of: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing by Gudrun Kissinger
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Last edited by ImportBot
October 8, 2020 | History
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An edition of In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing (1999)

In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing

19-21 May, 1999, Edinburgh, Scotland

by

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Publish Date
Publisher
SPIE
Language
English
Pages
344

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Previews available in: English

Subjects

Very large scale integration, Semiconductors, Microelectronics, Manufacturing processes, Design and construction, Materials, Congresses, Integrated circuits
Edition Availability
Cover of: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing: 19-21 May, 1999, Edinburgh, Scotland
1999, SPIE
in English

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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Wash., USA
Series
Proceedings EurOpt series, Proceedings / SPIE--the International Society for Optical Engineering ;, v. 3743, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3743.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7874 .I4633 1999, TK7874.I4633 1999

The Physical Object

Pagination
viii, 344 p. :
Number of pages
344

Edition Identifiers

Open Library
OL6804020M
Internet Archive
inlinecharacteri3743unse
ISBN 10
0819432237
LCCN
00266407
OCLC/WorldCat
41549721
Goodreads
3143189

Work Identifiers

Work ID
OL18252271W

Source records

Scriblio MARC record
Library of Congress MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
October 8, 2020 Edited by ImportBot import existing book
February 4, 2019 Created by MARC Bot import existing book