An edition of Stress-induced phenomena in metallization
(1996)
Stress-Induced Phenomena in Metallization
Third International Workshop (AIP Conference Proceedings, No. 373)
1 edition
by P. S. Ho
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Thin film devices, Metallic films, Defects, Congresses, Semiconductors, Aluminum filmsShowing 2 featured editions. View all 2 editions?
| Edition | Availability |
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1
Stress-Induced Phenomena in Metallization: Third International Workshop (AIP Conference Proceedings, No. 373)
April 15, 1996, American Institute of Physics
Hardcover
in English
- 1 edition
1563964392 9781563964398
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2
Stress-induced phenomena in metallization: third international workshop, Palo Alto, CA June 1995
1996, AIP Press
in English
1563964392 9781563964398
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WorldCat
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| February 7, 2019 | Created by MARC Bot | import existing book |