An edition of In situ real time characterization of thin films (2000)

In situ real time characterization of thin films

edited by Orlando Auciello, Alan R. Krauss

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Last edited by ImportBot
October 17, 2022 | History
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An edition of In situ real time characterization of thin films (2000)

In situ real time characterization of thin films

edited by Orlando Auciello, Alan R. Krauss

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Wiley
Language
English
Pages
263

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Previews available in: English

Subjects
Thin films, Physics

Showing 3 featured editions. View all 3 editions?

Edition Availability
Cover of: In Situ Real-Time Characterization of Thin Films
In Situ Real-Time Characterization of Thin Films
2008, Wiley & Sons, Incorporated, John
in English
Libraries near you: WorldCat
Cover of: In situ real time characterization of thin films
In situ real time characterization of thin films: edited by Orlando Auciello, Alan R. Krauss
2001, Wiley
in English
Libraries near you: WorldCat
Cover of: In Situ Real-Time Characterization of Thin Films
In Situ Real-Time Characterization of Thin Films
November 20, 2000, Wiley-Interscience
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

"A Wiley-Interscience publication."

Includes bibliographical references

Published in
New York

Classifications

Library of Congress
QC176.83 .I5 2001, QC176.83 .I5 2000, QC176.83.I5 2000

The Physical Object

Pagination
xi, 263 p. :
Number of pages
263

ID Numbers

Open Library
OL16994597M
Internet Archive
insiturealtimech0000unse
ISBN 10
0471241415
LCCN
00025162
Goodreads
464405

Source records

Miami University of Ohio MARC record
Library of Congress MARC record
Better World Books record
Internet Archive item record
Promise Item

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History

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October 17, 2022 Edited by ImportBot import existing book
February 17, 2019 Created by MARC Bot import existing book