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Previews available in: English
Subjects
Congresses, Metrology, Interferometry, Measurement, MethodologyEdition | Availability |
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1
Interferometry XI: techniques and analysis, 8-10 July 2002, Seattle USA
2002, SPIE
in English
0819445444 9780819445445
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Book Details
Edition Notes
Includes bibliographical references and index.
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The Physical Object
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