An edition of Advanced characterization techniques for optical, semiconductor, and data storage components (2002)

Advanced characterization techniques for optical, semiconductor, and data storage components

9-11 July 2002, Seattle, Washington, USA

by

Cover of: Advanced characterization techniques for optical, semiconductor, and data storage components by Angela Duparré
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Last edited by ImportBot
July 28, 2023 | History
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An edition of Advanced characterization techniques for optical, semiconductor, and data storage components (2002)

Advanced characterization techniques for optical, semiconductor, and data storage components

9-11 July 2002, Seattle, Washington, USA

by

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Publish Date
Publisher
SPIE
Language
English
Pages
192

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Previews available in: English

Subjects

Congresses, Metrology, Characterization, Information storage and retrieval systems, Semiconductors, Optical materials, Measurement
Edition Availability
Cover of: Advanced characterization techniques for optical, semiconductor, and data storage components
Advanced characterization techniques for optical, semiconductor, and data storage components: 9-11 July 2002, Seattle, Washington, USA
2002, SPIE
in English

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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Washington
Series
SPIE proceedings series,, v. 4779, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4779.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.36
Library of Congress
QC373 .A38 2002, QC373.A38 2002

The Physical Object

Pagination
viii, 192 p. :
Number of pages
192

ID Numbers

Open Library
OL3774868M
ISBN 10
0819445460
LCCN
2003535275
OCLC/WorldCat
51157395
Goodreads
3386524

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
July 28, 2023 Edited by ImportBot import existing book
August 1, 2020 Edited by ImportBot import existing book
March 11, 2019 Created by MARC Bot import existing book