Characterization of semiconductor materials

principles and methods

Characterization of semiconductor materials
G. E. McGuire
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Last edited by MARC Bot
December 20, 2022 | History

Characterization of semiconductor materials

principles and methods

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Publish Date
Publisher
Noyes Publications
Language
English

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Book Details


Edition Notes

Includes bibliographical references.

Published in
Park Ridge, N.J., U.S.A
Series
Materials science and process technology series

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
QC611.45 .C42 1989, QC611.45.C42 1989, QC611.45 .C42 1989eb

The Physical Object

Pagination
v. <1 > :

Edition Identifiers

Open Library
OL2208011M
ISBN 10
0815512007
LCCN
89030273
OCLC/WorldCat
49708634
Goodreads
4509163

Work Identifiers

Work ID
OL19195946W

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History

Download catalog record: RDF / JSON
December 20, 2022 Edited by MARC Bot import existing book
March 11, 2019 Created by MARC Bot import existing book