An edition of Machine vision systems for inspection and metrology VII (1998)

Machine vision systems for inspection and metrology VII

4-5 November, 1998, Boston, Massachusetts

by

Machine vision systems for inspection and met ...
Bruce G. Batchelor
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Last edited by MARC Bot
April 2, 2019 | History
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An edition of Machine vision systems for inspection and metrology VII (1998)

Machine vision systems for inspection and metrology VII

4-5 November, 1998, Boston, Massachusetts

by

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Publish Date
Publisher
SPIE
Language
English
Pages
386

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Subjects

Computer vision, Congresses, Optical measurements, Engineering inspection, Industrial applications, Automation
Edition Availability
Cover of: Machine vision systems for inspection and metrology VII
Machine vision systems for inspection and metrology VII: 4-5 November, 1998, Boston, Massachusetts
1998, SPIE
in English
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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE,, v. 3521, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3521.

Classifications

Dewey Decimal Class
670.42/5
Library of Congress
TA1634 .M3355 1998, TA1634.M3355 1998

The Physical Object

Pagination
xi, 386 p. :
Number of pages
386

ID Numbers

Open Library
OL63159M
ISBN 10
0819429821
LCCN
99159849
OCLC/WorldCat
40261494
Goodreads
768851

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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