An edition of Testing, reliability, and application of micro- and nano-material systems II (2004)

Testing, reliability, and application of micro- and nano-material systems II

15-17 March, 2004, San Diego, California, USA

by and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Cover of: Testing, reliability, and application of micro- and nano-material systems II by Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Preview Only
Borrow Listen

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Notes

Check nearby libraries

Buy this book

Last edited by ImportBot
August 1, 2020 | History
Edit
An edition of Testing, reliability, and application of micro- and nano-material systems II (2004)

Testing, reliability, and application of micro- and nano-material systems II

15-17 March, 2004, San Diego, California, USA

by and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
SPIE
Language
English
Pages
272

Check nearby libraries

Buy this book

Previews available in: English

Subjects
Microelectromechanical systems, Materials, Congresses, Nanostructured materials, Photonics, Testing, Electrooptical devices, Electrooptics, Electromechanical devices
Edition Availability
Cover of: Testing, reliability, and application of micro- and nano-material systems II
Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA
2004, SPIE
in English
Libraries near you: WorldCat

Add another edition?

Book Details

Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
SPIE proceedings series ;, v. 5392, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 5392.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.36
Library of Congress
TA1750 .T472 2004, TA1750.T472 2004

The Physical Object

Pagination
viii, 272 p. :
Number of pages
272

ID Numbers

Open Library
OL3329379M
Internet Archive
testingreliabili0000unse_e2x1
ISBN 10
0819453099
LCCN
2004304501
OCLC/WorldCat
56094618
Goodreads
3565279

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON
August 1, 2020 Edited by ImportBot import existing book
April 2, 2019 Created by MARC Bot import existing book