An edition of Secondary Ion Mass Spectrometry SIMS IV (1984)

Secondary Ion Mass Spectrometry SIMS IV

Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983

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Cover of: Secondary Ion Mass Spectrometry SIMS IV by A. Benninghoven
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Last edited by MARC Bot
July 7, 2019 | History
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An edition of Secondary Ion Mass Spectrometry SIMS IV (1984)

Secondary Ion Mass Spectrometry SIMS IV

Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Springer Berlin Heidelberg
Language
English

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Previews available in: English

Subjects
Physical organic chemistry, Chemistry
Edition Availability
Cover of: Secondary Ion Mass Spectrometry SIMS IV
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
Feb 09, 2012, Springer
paperback
Libraries near you: WorldCat
Cover of: Secondary Ion Mass Spectrometry SIMS IV
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
1984, Springer Berlin Heidelberg
electronic resource : in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.

Published in
Berlin, Heidelberg
Series
Springer Series in Chemical Physics -- 36, Springer Series in Chemical Physics -- 36

Classifications

Dewey Decimal Class
541
Library of Congress
QD450-882, QD1-999, QD96.M3

The Physical Object

Format
[electronic resource] :
Pagination
v.

ID Numbers

Open Library
OL27086762M
Internet Archive
secondaryionmass1983sigm
ISBN 10
3642822584, 3642822568
ISBN 13
9783642822582, 9783642822568
OCLC/WorldCat
851373185

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