An edition of Kelvin Probe Force Microscopy (2011)

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

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Cover of: Kelvin Probe Force Microscopy by Sascha Sadewasser, Thilo Glatzel
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Last edited by ImportBot
August 25, 2020 | History
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An edition of Kelvin Probe Force Microscopy (2011)

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

by and

  • 0 Ratings
  • 1 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Springer
Pages
545

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Subjects
Microscopy, Scanning probe microscopy, Electrostatics

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Edition Availability
Cover of: Kelvin Probe Force Microscopy
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Jan 04, 2019, Springer
paperback
  • Not in Library
Libraries near you: WorldCat
Cover of: Kelvin Probe Force Microscopy
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Mar 19, 2018, Springer
hardcover
Libraries near you: WorldCat
Cover of: Kelvin Probe Force Microscopy
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Nov 30, 2013, Springer
paperback
Libraries near you: WorldCat
Cover of: Kelvin Probe Force Microscopy
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
2011, Springer
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Source title: Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences (65))

Classifications

Library of Congress
QD95-96

The Physical Object

Format
paperback
Number of pages
545

ID Numbers

Open Library
OL28319855M
ISBN 10
3030092984
ISBN 13
9783030092986

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amazon.com record
Better World Books record

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History

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August 25, 2020 Edited by ImportBot import existing book
August 3, 2020 Edited by ImportBot import existing book
April 22, 2020 Created by ImportBot import new book