An edition of Secondary Ion Mass Spectrometry SIMS II
(2011)
Secondary Ion Mass Spectrometry SIMS II
Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford University, Stanford, California, USA August 27-31 1979
by A. Benninghoven, C.A. Jr Evans, R.A. Powell, R. Shimizu, and H.A. Storms
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Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford University, Stanford, California, USA August 27-31 1979
2013, Springer
in English
3642618715 9783642618710
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Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford ...
Dec 13, 2011, Springer
paperback
3642618731 9783642618734
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| December 8, 2022 | Edited by MARC Bot | import existing book |
| October 10, 2020 | Edited by ImportBot | import existing book |
| October 2, 2020 | Created by ImportBot | import new book |