An edition of Wei dian zi ji shu de ke kao xing
(2013)
Wei dian zi ji shu de ke kao xing
hu lian , qi jian ji xi tong = Reliability of Microtechnology : Interconnects, Devices and Systems
Di yi ban
by Johan Liu and Fu Guo
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Wei dian zi ji shu de ke kao xing: hu lian , qi jian ji xi tong = Reliability of Microtechnology : Interconnects, Devices and Systems
2013, Ke xue chu ban she
in Chinese
- Di yi ban
7030376064 9787030376060
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Translation of: Reliability of Microtechnology : Interconnects, Devices and Systems
Includes bibliographical references.
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| November 14, 2020 | Created by MARC Bot | import new book |