An edition of Bridging faults and IDDQ testing (1992)

Bridging faults and IDDQ testing

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Bridging faults and IDDQ testing
Yashwant K. Malaiya, Rochit Ra ...
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Last edited by MARC Bot
November 15, 2020 | History
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An edition of Bridging faults and IDDQ testing (1992)

Bridging faults and IDDQ testing

by and

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Publish Date
Publisher
IEEE Computer Society Press
Language
English
Pages
128

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Subjects

Complementary Metal oxide semiconductors, Testing, Data processing, Iddq testing
Edition Availability
Cover of: Bridging faults and IDDQ testing
Bridging faults and IDDQ testing
1992, IEEE Computer Society Press
in English

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Book Details

Edition Notes

Includes bibliographical reference (p. 122-127).
"Sponsored by the IEEE Compter Society Technical Committee on Test Technology."

Published in
Los Alamitos, Calif
Series
IEEE Computer Society Press technology series

Classifications

Dewey Decimal Class
621.3815/48
Library of Congress
TK7871.99.M44 B75 1992

The Physical Object

Pagination
vi, 128 p. :
Number of pages
128

ID Numbers

Open Library
OL1726830M
ISBN 10
0818632151, 081863216X
LCCN
92030950
Goodreads
1223713

Source records

Library of Congress MARC record
Promise Item
ISBNdb

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November 15, 2020 Created by MARC Bot import existing book