Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques

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Nondestructive tests used to insure the integ ...
George G. Harman, George G. Ha ...
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Last edited by MARC Bot
November 15, 2023 | History

Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques

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Cover of: Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.
Cover of: Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques
Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques
1979, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English

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Book Details


Edition Notes

Includes bibliographical references.

Published in
Washington, D.C
Series
Semiconductor measurement technology, NBS special publication ; 400-59, NBS special publication ;, 400-59.

Classifications

Dewey Decimal Class
602/.18 s, 621.3815/2/0287
Library of Congress
QC100 .U57 no. 400-59, TK7871.85 .U57 no. 400-59

The Physical Object

Pagination
v, 66 p. :
Number of pages
66

ID Numbers

Open Library
OL4062733M
LCCN
79600131
OCLC/WorldCat
5535581

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November 15, 2023 Edited by MARC Bot import existing book
February 6, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page