An edition of MEMS length and strain measurements using an optical interferometer
(2001)
MEMS length and strain measurements using an optical interferometer
by J. C. Marshall
Share
×Close
This work doesn't have a description yet. Can you add one?
Publish Date
2001
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
81
Check nearby libraries
Buy this book
| Edition | Availability |
|---|---|
1
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
aaaa
|
|
2
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
|
3
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
Book Details
Edition Notes
"August 2, 2001."
Shipping list no.: 2002-0384-M
Includes bibliographical references (p. 42-44)
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 1 microfiche : negative
The Physical Object
Edition Identifiers
Work Identifiers
Community Reviews (0)
| February 12, 2010 | Edited by WorkBot | add more information to works |
| December 10, 2009 | Created by WorkBot | add works page |