An edition of In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique (1989)

In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique

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In situ determination of thermal profiles dur ...
Kwang-su Ch'oe, Kwang-su Ch'oe
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Last edited by MARC Bot
July 29, 2024 | History
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An edition of In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique (1989)

In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique

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Publish Date
Language
English
Pages
140

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Edition Availability
Cover of: In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique
In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique
1989
in English
Cover of: In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique
In situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique
1989
in English

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Book Details

Edition Notes

"89-19,143."

Thesis (Ph. D.)--Columbia University, 1989.

Includes bibliographical references.

Microfilm. Ann Arbor, Mich. : University Microfilms International, 1989. 1 microfilm reel ; 35 mm.

The Physical Object

Pagination
vi, 140 leaves.
Number of pages
140

ID Numbers

Open Library
OL52933532M
OCLC/WorldCat
507258129

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marc_columbia MARC record

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