An edition of Point defects in semiconductors
(1981)
Point defects in semiconductors
by M. Lannoo, Michel Lannoo, and J. Bourgoin
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Subjects
Defects, Point defects, Semiconductors| Edition | Availability |
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1
Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences)
June 1983, Springer
in English
0387115153 9780387115153
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Book Details
Table of Contents
1. Theoretical aspects
2. Experimental aspects.
Edition Notes
Includes bibliographical references and index.
Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins.
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| July 30, 2019 | Edited by MARC Bot | associate edition with work OL4455073W |
| December 5, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| December 10, 2009 | Created by WorkBot | add works page |