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Subjects
Defects, Point defects, SemiconductorsEdition | Availability |
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Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences)
June 1983, Springer
in English
0387115153 9780387115153
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Feedback?July 30, 2019 | Edited by MARC Bot | associate edition with work OL4455073W |
December 5, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
December 10, 2009 | Created by WorkBot | add works page |