An edition of Differential capacitance-voltage profiling of Schottky barrier diodes for measuring implanted depth distributions in silicon (1982)

Differential capacitance-voltage profiling of schottky barrier diodes for measuring implanted depth distributions in silicon

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Differential capacitance-voltage profiling of ...
Wilson, Robert G.
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Last edited by Open Library Bot
December 5, 2010 | History
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An edition of Differential capacitance-voltage profiling of Schottky barrier diodes for measuring implanted depth distributions in silicon (1982)

Differential capacitance-voltage profiling of schottky barrier diodes for measuring implanted depth distributions in silicon

by

  • 0 Ratings
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  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
Language
English
Pages
52

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Subjects
Diodes, Schottky-barrier, Diodes, Schottky=barrier, Electric measurements, Ion implantation, Semiconductors, Testing

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Edition Availability
Cover of: Differential capacitance-voltage profiling of Schottky barrier diodes for measuring implanted depth distributions in silicon
Differential capacitance-voltage profiling of Schottky barrier diodes for measuring implanted depth distributions in silicon
1982, U.S. Dept. of Commerce, National Bureau of Standards, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Differential capacitance-voltage profiling of schottky barrier diodes for measuring implanted depth distributions in silicon
Differential capacitance-voltage profiling of schottky barrier diodes for measuring implanted depth distributions in silicon
1982, U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
in English
  • Not in Library

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Book Details

Edition Notes

Includes bibliographical references.
"This work was sponsored by Defense Advanced Research Projects Agency."
"Hughes Research Laboratories."
"Issued February 1982."
Item 247 (microfiche)

Published in
Washington, D.C, [Springfield, VA
Series
NBS special publication ;, 400-71, Semiconductor measurement technology

Classifications

Library of Congress
QC100 .U57 no. 400-71, TK7871.89.S35 .U57 no. 400-71

The Physical Object

Pagination
v, 52 p. :
Number of pages
52

ID Numbers

Open Library
OL3919278M
LCCN
81600162

Source records

Library of Congress MARC record

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History

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December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page