An edition of Electron Beam Ion Sources And Traps And Their Applications
(2001)
Electron Beam Ion Sources And Traps And Their Applications
8th International Symposium (AIP Conference Proceedings)
1 edition
by K. Prelec
Share
×Close
This work doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Subjects
Ion sources, Congresses, Electron beams, Trapped ions| Edition | Availability |
|---|---|
1
Electron Beam Ion Sources And Traps And Their Applications: 8th International Symposium (AIP Conference Proceedings)
2001, Springer
Hardcover
in English
- 1 edition
0735400113 9780735400115
|
aaaa
|
Book Details
Classifications
The Physical Object
ID Numbers
Community Reviews (0)
| November 14, 2023 | Edited by MARC Bot | import existing book |
| December 3, 2020 | Edited by MARC Bot | import existing book |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| December 10, 2009 | Created by WorkBot | add works page |