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Last edited anonymously
April 30, 2008 | History
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Guiseppe La Rosa

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  • Cover of: Reliability wearout mechanisms in advanced CMOS technologies

    First published in 2008 — 3 editions
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Subjects

CMOS-Schaltung, Circuits & components, Complementary Metal oxide semiconductors, Electricity, Engineering, General Theory of Computing, Metal oxide semiconductors, complementary, Reliability, Reliability (engineering), Schaltungsentwurf, Science/Mathematics, Technology & Engineering

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ID Numbers

  • OLID: OL3422187A

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History

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April 30, 2008 Created by an anonymous user initial import