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Last edited by LC Bot
July 27, 2011 | History
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Alvin Wayne Strong

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Born 1946

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  • Cover of: Reliability wearout mechanisms in advanced CMOS technologies

    First published in 2008 — 3 editions
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We need a photo of Alvin Wayne Strong

Born 1946

Subjects

CMOS-Schaltung, Circuits & components, Complementary Metal oxide semiconductors, Electricity, Engineering, General Theory of Computing, Metal oxide semiconductors, complementary, Reliability, Reliability (engineering), Schaltungsentwurf, Science/Mathematics, Technology & Engineering

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ID Numbers

  • OLID: OL6947834A

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History

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July 27, 2011 Created by LC Bot import new book