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Last edited by ImportBot
December 1, 2010 | History

Daniel J. C. Herr

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  • Cover of: Nanoscience and Nanoengineering: Advances and Applications

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  • Cover of: Nanoelectronics
    First published in 2004 1 edition

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  • Cover of: Metrology, inspection, and process control for microlithography XVII: 24-27 February, 2003, Santa Clara, California, USA

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  • Cover of: Metrology, inspection, and process control for microlithography XVI: 4-7 March, 2002, Santa Clara, [California] USA

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  • Cover of: Alternative lithographic technologies III: 1-3 March 2011, San Jose, California, United States

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  • Cover of: Alternative lithographic technologies II: 23-25 February 2010, San Jose, California, United States

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  • Cover of: Directed Self-Assembly for Nanopatterning: November 30-December 5, 2014, Boston, Massachusetts, USA

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December 1, 2010 Created by ImportBot new author