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Previews available in: English
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Edition | Availability |
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1
Reliability Wearout Mechanisms in Advanced CMOS Technologies
2009, Wiley & Sons, Incorporated, John
in English
047045525X 9780470455258
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2
Reliability wearout mechanisms in advanced CMOS technologies
2009, IEEE Press, Wiley
in English
0471731722 9780471731726
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3
Reliability Wearout Mechanisms in Advanced CMOS Technologies (Ieee Press Series on Microelectronic Systems)
April 22, 2008, Ieee
Hardcover
in English
0471731722 9780471731726
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Book Details
Table of Contents
Introduction / Alvin W. Strong
Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé
Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé
Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa
Hot carriers / Stewart E. Rauch, III
Stress-induced voiding / Timothy D. Sullivan
Electromigration / Timothy D. Sullivan.
Edition Notes
Includes bibliographical references and index.
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- Created July 27, 2011
- 5 revisions
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July 17, 2023 | Edited by ImportBot | import existing book |
May 15, 2020 | Edited by CoverBot | Added new cover |
July 28, 2014 | Edited by ImportBot | import new book |
April 6, 2014 | Edited by ImportBot | Added IA ID. |
July 27, 2011 | Created by LC Bot | Imported from Library of Congress MARC record |