An edition of Advances in scanning probe microscopy (2000)

Advances in Scanning Probe Microscopy

by Y. Watanabe

Y. Watanabe, T. Sakurai, Y. Wa ...

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October 5, 2021 | History

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An edition of Advances in scanning probe microscopy (2000)

Advances in Scanning Probe Microscopy

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

Publish Date

2012

Publisher

Springer Berlin / Heidelberg

Language

English

Pages

343

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Previews available in: English

Edition	Availability
1 Advances in Scanning Probe Microscopy 2012, Springer Berlin / Heidelberg in English 3642630847 9783642630842	aaaa Locate
2 Advances in Scanning Probe Microscopy 2012, Springer London, Limited in English 3642569498 9783642569494	zzzz Locate
3 Advances in Scanning Probe Microscopy 2000, Island Press in English 3642569501 9783642569500	zzzz Locate
4 Advances in Scanning Probe Microscopy (Advances in Materials Research) April 26, 2000, Springer Hardcover in English - 1 edition 3540667180 9783540667186	zzzz Locate