Advances in Scanning Probe Microscopy

Advances in Scanning Probe Microscopy
Y. Watanabe, T. Sakurai, Y. Wa ...
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Last edited by ImportBot
February 27, 2022 | History

Advances in Scanning Probe Microscopy

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

Publish Date
Language
English

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Previews available in: English

Edition Availability
Cover of: Advances in Scanning Probe Microscopy
Advances in Scanning Probe Microscopy
2012, Springer London, Limited
in English
Cover of: Advances in Scanning Probe Microscopy
Advances in Scanning Probe Microscopy
2012, Springer Berlin / Heidelberg
in English
Cover of: Advances in Scanning Probe Microscopy (Advances in Materials Research)
Advances in Scanning Probe Microscopy (Advances in Materials Research)
April 26, 2000, Springer
Hardcover in English - 1 edition
Cover of: Advances in Scanning Probe Microscopy
Advances in Scanning Probe Microscopy
2000, Island Press
in English

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Book Details


Classifications

Library of Congress
TK7800-8360

The Physical Object

Pagination
xiv, 343

ID Numbers

Open Library
OL37235175M
ISBN 13
9783642569494

Source records

Better World Books record

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February 27, 2022 Created by ImportBot Imported from Better World Books record