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Previews available in: English
Showing 3 featured editions. View all 3 editions?
Edition | Availability |
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1
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English
- 2nd completely rev. and updated ed.
3540639764 9783540639763
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2
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
January 1986, Springer
in English
0387135308 9780387135304
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3
Scanning electron microscopy: physics of image formation and microanalysis
1985, Springer-Verlag
in English
0387135308 9780387135304
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WorldCat
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Book Details
First Sentence
"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."
ID Numbers
First Sentence
"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."
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- Created April 29, 2008
- 6 revisions
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December 29, 2011 | Edited by LC Bot | import new book |
December 29, 2011 | Edited by LC Bot | import new book |
August 5, 2010 | Edited by IdentifierBot | added LibraryThing ID |
April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |