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Subjects
Semiconductors, Congresses, Defects, MicroscopyEdition | Availability |
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1
Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
September 1985, Materials Research Society
Hardcover
in English
0931837111 9780931837111
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2
Microscopic identification of electronic defects in semiconductors: symposium held April 15-18, 1985, San Francisco, California, U.S.A.
1985, Materials Research Society
in English
0931837111 9780931837111
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- Created April 29, 2008
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July 31, 2019 | Edited by MARC Bot | associate edition with work OL18951750W |
April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |