Microscopic Identification of Electronic Defects in Semiconductors

Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)

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Last edited by MARC Bot
July 31, 2019 | History

Microscopic Identification of Electronic Defects in Semiconductors

Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)

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Publish Date
Language
English
Pages
604

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Previews available in: English

Book Details


The Physical Object

Format
Hardcover
Number of pages
604

ID Numbers

Open Library
OL8384916M
ISBN 10
0931837111
ISBN 13
9780931837111
Goodreads
3481278

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 31, 2019 Edited by MARC Bot associate edition with work OL18951750W
April 24, 2010 Edited by Open Library Bot Fixed duplicate goodreads IDs.
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
April 14, 2010 Edited by Open Library Bot Linked existing covers to the edition.
April 29, 2008 Created by an anonymous user Imported from amazon.com record