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Subjects
Semiconductors, Congresses, Defects, MicroscopyEdition | Availability |
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1
Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
September 1985, Materials Research Society
Hardcover
in English
0931837111 9780931837111
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2
Microscopic identification of electronic defects in semiconductors: symposium held April 15-18, 1985, San Francisco, California, U.S.A.
1985, Materials Research Society
in English
0931837111 9780931837111
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Book Details
Edition Notes
Includes bibliographies and indexes.
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- Created April 1, 2008
- 8 revisions
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January 15, 2023 | Edited by ImportBot | import existing book |
December 12, 2022 | Edited by MARC Bot | import existing book |
August 17, 2021 | Edited by MARC Bot | import existing book |
November 2, 2020 | Edited by MARC Bot | import existing book |
April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |