An edition of Infrared Ellipsometry on Semiconductor Layer Structures
(2005)
Infrared Ellipsometry on Semiconductor Layer Structures
Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)
1 edition
by Mathias Schubert
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| Edition | Availability |
|---|---|
1
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)
January 12, 2005, Springer
Hardcover
in English
- 1 edition
3540232494 9783540232490
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Book Details
First Sentence
"Semiconductor device structures consist of stacked layer systems with layers of different alloy compositions, individual dopant incorporation, free-charge-carrier properties, and possibly with hundreds of interfaces."
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- Created April 30, 2008
- 15 revisions
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| January 5, 2023 | Edited by MARC Bot | import existing book |
| December 30, 2022 | Edited by MARC Bot | import existing book |
| February 25, 2022 | Edited by ImportBot | import existing book |
| December 8, 2020 | Edited by MARC Bot | import existing book |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |