An edition of Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 (1999)

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [Ipfa '99

5-9 July, 1999, Orchard Hotel

by , , , and

Cover of: Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [Ipfa '99 by International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th 1999 Singapore), IEEE Electron Devices Society, IEEE Reliability Society, IEEE Components Packaging & Manufacturin, IEEE Electron Devices Society, IEEE Reliability Society, IEEE Components Packaging & Manufacturin
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Last edited by MARC Bot
July 31, 2019 | History
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An edition of Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 (1999)

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [Ipfa '99

5-9 July, 1999, Orchard Hotel

by , , , and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
IEEE Standards Office
Language
English
Pages
209

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Subjects

Congresses, Integrated circuits, Testing, Defects, Electronics - Circuits - General, Technology & Industrial Arts
Edition Availability
Cover of: Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [Ipfa '99
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [Ipfa '99: 5-9 July, 1999, Orchard Hotel
September 1999, IEEE Standards Office
Unknown Binding in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99: 5-9 July, 1999, Orchard Hotel, Singapore]
1999, IEEE
in English
Libraries near you: WorldCat
Cover of: Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
December 1999, IEEE Standards Office
Paperback in English
Libraries near you: WorldCat

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Book Details

Classifications

Library of Congress
TK7874 .I47377 1999

The Physical Object

Format
Unknown Binding
Number of pages
209

ID Numbers

Open Library
OL10999389M
ISBN 10
0780351886
ISBN 13
9780780351882
LCCN
98088539
OCLC/WorldCat
42675720
Goodreads
3213187

Source records

Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
July 31, 2019 Edited by MARC Bot associate edition with work OL13498139W
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
January 28, 2010 Edited by WorkBot add more information to works
December 11, 2009 Created by WorkBot add works page