An edition of Reliability wearout mechanisms in advanced CMOS technologies (2008)

Reliability wearout mechanisms in advanced CMOS technologies

by , , , , , and

Cover of: Reliability wearout mechanisms in advanced CMOS technologies by Alvin Wayne Strong, Alvin W. Strong, Ernest Y. Wu, Rolf-peter Vollertsen, Jordi Sune, Guiseppe La Rosa, Alvin Wayne Strong
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Last edited by ImportBot
July 17, 2023 | History
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An edition of Reliability wearout mechanisms in advanced CMOS technologies (2008)

Reliability wearout mechanisms in advanced CMOS technologies

by , , , , , and

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Publish Date
Publisher
IEEE Press, Wiley
Language
English
Pages
624

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Previews available in: English

Subjects

Complementary Metal oxide semiconductors, Reliability, CMOS-Schaltung, Schaltungsentwurf, Circuits & components, General Theory of Computing, Electricity, Technology & Engineering, Science/Mathematics, Metal oxide semiconductors, complementary, Reliability (engineering), Engineering
Edition Availability
Cover of: Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
2009, IEEE Press, Wiley
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
2009, Wiley & Sons, Incorporated, John
in English
Libraries near you: WorldCat
Cover of: Reliability Wearout Mechanisms in Advanced CMOS Technologies (Ieee Press Series on Microelectronic Systems)
Reliability Wearout Mechanisms in Advanced CMOS Technologies (Ieee Press Series on Microelectronic Systems)
April 22, 2008, Ieee
Hardcover in English
Libraries near you: WorldCat

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Book Details

Table of Contents

Introduction / Alvin W. Strong
Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé
Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé
Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa
Hot carriers / Stewart E. Rauch, III
Stress-induced voiding / Timothy D. Sullivan
Electromigration / Timothy D. Sullivan.

Edition Notes

Includes bibliographical references and index.

Published in
Piscataway, NJ, Hoboken, NJ
Series
IEEE Press series on microelectronic systems, IEEE Press series on microelectronic systems

Classifications

Library of Congress
TK7871.99.M44 R455 2009, TK7871.99.M44R455

The Physical Object

Pagination
xv, 624 p. :
Number of pages
624

ID Numbers

Open Library
OL24861484M
Internet Archive
reliabilitywearo00stro
ISBN 10
0471731722, 0470455268
ISBN 13
9780471731726, 9780470455265
LCCN
2011377262
OCLC/WorldCat
176924613

Source records

Library of Congress MARC record
Internet Archive item record
Better World Books record

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History

Download catalog record: RDF / JSON
July 17, 2023 Edited by ImportBot import existing book
September 16, 2021 Edited by ImportBot import existing book
July 31, 2019 Edited by MARC Bot associate edition with work OL15955446W
July 27, 2011 Created by LC Bot import new book