An edition of Oxide reliability (2002)

Oxide reliability

a summary of silicon oxide wearout, breakdown, and reliability

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Cover of: Oxide reliability by D. J. Dumin
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Last edited by ImportBot
August 17, 2023 | History
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An edition of Oxide reliability (2002)

Oxide reliability

a summary of silicon oxide wearout, breakdown, and reliability

by

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
World Scientific
Language
English
Pages
270

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Previews available in: English

Subjects

Reliability, Metal oxide semiconductors, Silicon oxide, Deterioration, Oxides, Semiconductors
Edition Availability
Cover of: Oxide reliability
Oxide reliability: a summary of silicon oxide wearout, breakdown, and reliability
2002, World Scientific
in English
Cover of: Oxide Reliability
Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability
2002, World Scientific Publishing Co Pte Ltd
in English

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Book Details

Edition Notes

Includes bibliographical references.

Published in
[River Edge, NJ]
Series
Selected topics in electronics and systems -- v. 23

Classifications

Dewey Decimal Class
621.39/732
Library of Congress
TK7871.99.M44, TK7871.99.M44 O95 2002, TK7871.99.M44O95

The Physical Object

Pagination
ix, 270 p. :
Number of pages
270

ID Numbers

Open Library
OL22147439M
Internet Archive
oxidereliability00dumi
ISBN 10
9810248423
LCCN
2002279812
Goodreads
1567697

Source records

Talis record
Internet Archive item record
Library of Congress MARC record
Promise Item
Better World Books record

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History

Download catalog record: RDF / JSON
August 17, 2023 Edited by ImportBot import existing book
July 6, 2019 Edited by MARC Bot import existing book
March 13, 2019 Created by MARC Bot import existing book