Advances in Scanning Probe Microscopy (Advances in Materials Research)

1 edition
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Last edited by ImportBot
July 31, 2020 | History

Advances in Scanning Probe Microscopy (Advances in Materials Research)

1 edition

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

Publish Date
Publisher
Springer
Language
English
Pages
341

Buy this book

Previews available in: English

Edition Availability
Cover of: Advances in Scanning Probe Microscopy
Advances in Scanning Probe Microscopy
2012, Springer London, Limited
in English
Cover of: Advances in Scanning Probe Microscopy
Advances in Scanning Probe Microscopy
2012, Springer Berlin / Heidelberg
in English
Cover of: Advances in Scanning Probe Microscopy (Advances in Materials Research)
Advances in Scanning Probe Microscopy (Advances in Materials Research)
April 26, 2000, Springer
Hardcover in English - 1 edition
Cover of: Advances in Scanning Probe Microscopy
Advances in Scanning Probe Microscopy
2000, Island Press
in English

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Book Details


Classifications

Library of Congress
TK7800-8360TK7874-78, QH212.S33 A38 2000

The Physical Object

Format
Hardcover
Number of pages
341
Dimensions
9.1 x 6.3 x 0.4 inches
Weight
1.5 pounds

ID Numbers

Open Library
OL9063167M
Internet Archive
advancesscanning00sasa
ISBN 10
3540667180
ISBN 13
9783540667186
LCCN
99088035
OCLC/WorldCat
42934618
Library Thing
4657724
Goodreads
1015475

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History

Download catalog record: RDF / JSON
July 31, 2020 Edited by ImportBot import existing book
June 28, 2019 Created by MARC Bot import existing book