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Previews available in: English
Edition | Availability |
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1
Scanning force microscopy: with applications to electric, magnetic, and atomic forces
1994, Oxford University Press
in English
- Rev. ed.
019509204X 9780195092042
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2
Scanning force microscopy: with applications to electric, magnetic, and atomic forces
1991, Oxford University Press
in English
0195062701 9780195062700
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Book Details
Edition Notes
Includes bibliographical references (p. 233-259) and index.
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Feedback?July 15, 2024 | Edited by MARC Bot | import existing book |
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