Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)

1 edition
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Last edited by MARC Bot
January 5, 2023 | History

Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)

1 edition

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Publish Date
Publisher
Springer
Language
English
Pages
193

Buy this book

Previews available in: English

Book Details


First Sentence

"Semiconductor device structures consist of stacked layer systems with layers of different alloy compositions, individual dopant incorporation, free-charge-carrier properties, and possibly with hundreds of interfaces."

Classifications

Library of Congress
QC1 .S797 vol. 209, QC443 .S797 vol. 209, QC630-648

The Physical Object

Format
Hardcover
Number of pages
193
Dimensions
9.4 x 6.3 x 0.6 inches
Weight
1 pounds

ID Numbers

Open Library
OL9055044M
Internet Archive
informationdevel00schu
ISBN 10
3540232494
ISBN 13
9783540232490
LCCN
2004113130
OCLC/WorldCat
57222866
Goodreads
1509266

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History

Download catalog record: RDF / JSON
January 5, 2023 Edited by MARC Bot import existing book
February 25, 2022 Edited by ImportBot import existing book
July 28, 2014 Edited by ImportBot import new book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page