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The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.
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Previews available in: English
Edition | Availability |
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1
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination
Oct 03, 2013, Springer
paperback
3662146371 9783662146378
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2
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination
2003, Springer
in English
354046008X 9783540460084
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3
Anomalous X-ray scattering for materials characterization: atomic-scale structure determination
2002, Springer
in English
3540434437 9783540434436
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Includes bibliographical references and index.
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