An edition of New technology challenges metrology
(1981)
New technology challenges metrology
by Judson C. French
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Publish Date
1981
Publisher
U.S. Department of Commerce, National Bureau of Standards,
For sale by the Supt. of Docs., U.S. G.P.O.
Language
English
Pages
87
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Subjects
Mensuration, Technological innovations, MeasurementShowing 2 featured editions. View all 2 editions?
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New technology challenges metrology
1981, U.S. Department of Commerce, National Bureau of Standards, For sale by the Supt. of Docs., U.S. G.P.O.
in English
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Book Details
Edition Notes
"Presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, Argentina, September 4-7, 1979."
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
"Issued July 1981."
S/N 003-003-02341-8
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| October 21, 2020 | Edited by MARC Bot | import existing book |
| December 5, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| December 10, 2009 | Created by WorkBot | add works page |