An edition of Transmission electron microscopy and diffractometry of materials
(2002)
Transmission electron microscopy and diffractometry of materials
2nd ed.
by B. Fultz, Brent Fultz, and James M. Howe
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Subjects
Materials, Microscopy, Transmission electron microscopy, X-ray diffractometer, Applied physics & special topics, Testing Of Materials, Electron Microscopy, Science, Science/Mathematics, Nanostructures, Engineering - General, Physics, Diffraction, Imaging, Materials characterization, Spectroscopy, Technology / Material Science, Transmission electron microsco, Electron Microscopes & Microscopy, Material ScienceShowing 2 featured editions. View all 2 editions?
| Edition | Availability |
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1
Transmission Electron Microscopy and Diffractometry of Materials
March 14, 2005, Springer
Hardcover
in English
- 2nd ed. 2002. Corr. 2nd printing edition
3540437649 9783540437642
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2
Transmission electron microscopy and diffractometry of materials
2002, Springer
in English
- 2nd ed.
3540437649 9783540437642
|
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Libraries near you:
WorldCat
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Book Details
Edition Notes
Includes bibliographical references and index.
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| July 30, 2019 | Edited by MARC Bot | associate edition with work OL9078318W |
| December 3, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| December 10, 2009 | Created by WorkBot | add works page |